Super-resolution imaging for sub-IR frequencies based on total internal reflection
نویسندگان
چکیده
منابع مشابه
Single-shot super-resolution total internal reflection fluorescence microscopy
20 We demonstrate a simple method for combining instant structured illumination microscopy (SIM) 21 with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF 22 (down to 115 +/13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. 23 We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-r...
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ژورنال
عنوان ژورنال: Optica
سال: 2021
ISSN: 2334-2536
DOI: 10.1364/optica.408678